Electron Microscopy: Principles and Fundamentals

ISBN: 3527294791

Category: Technical

Tag: Science/Engineering


Posted on 2009-08-11. By anonymous.

Description


Electron Microscopy: Principles and Fundamentals
Publisher: Wiley-VCH | ISBN: 3527294791 | edition 1997 | PDF | 517 pages | 26,3 mb

Derived from the successful three-volume Handbook of Microscopy, this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the characterization of surfaces offers a competent comparison of the feasibilities of the latest developments in this field of research.
Topics include:
* Stationary Beam Methods: Transmission Electron Microscopy/ Electron Energy Loss Spectroscopy/ Convergent Electron Beam Diffraction/ Low Energy Electron Microscopy/ Electron Holographic Methods
* Scanning Beam Methods: Scanning Transmission Electron Microscopy/ Scanning Auger and XPS Microscopy/ Scanning Microanalysis/ Imaging Secondary Ion Mass Spectrometry
* Magnetic Microscopy: Scanning Electron Microscopy with Polarization Analysis/ Spin Polarized Low Energy Electron Microscopy



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