[share_ebook] Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials (Springer Series in Advanced Microelectronics)
Author: Martin Langenkamp, Otwin Breitenstein, Wilhelm Warta
Date: 2011-10-01
Pages: 255
Publisher: Springer
Category: Study
Tag: Physics
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Posted on 2011-10-31, by sharebookfree.
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Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials (Springer Series in Advanced Microelectronics)
Martin Langenkamp, Otwin Breitenstein, Wilhelm Warta | Springer | 2011-10-01 | 255 pages | English | PDF
This is the first book on lock-in thermography, an analytical method applied to the diagnosis of microelectronic devices. This useful introduction and guide reviews various experimental approaches to lock-in thermography, with special emphasis on the lock-in IR thermography developed by the authors themselves.
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