[share_ebook] VLSI Test Principles and Architectures: Design for Testability [ReUpload]

ISBN: 9780123705976

Pages: 808

Language: English

Publisher: Morgan Kaufmann

Format: pdf

Category: Technical


Posted on 2012-02-05, by ecabuk.

Description



This e-book is a comprehensive guide to new DFT techniques that will show the readers how to design a testable and high quality solution, generate down test value, enhance solution top quality and yield, and speed up time-to-industry and time-to-volume. · Most up-to-date protection of design and style for testability. · Protection of sector practices commonly found in business DFT instruments but not reviewed in other books. · Many, sensible examples in every single chapter illustrating standard VLSI check concepts and DFT architectures. · Lecture slides and workout solutions for all chapters are now offered. · Instructors are also eligible for downloading PPT slide files and MSWORD options files from the manual web site.

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