[share_ebook] VLSI Test Principles and Architectures: Design for Testability


Author: Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen

Date: 2006-07-21

ISBN: 9780123705976

Pages: 808

Language: English

Format: pdf

Category: Technical


Posted on 2011-12-28, by ecabuk.

Description



This book is a extensive guide to new DFT techniques that will display the viewers how to design and style a testable and high quality item, drive down check expense, improve product high quality and yield, and velocity up time-to-market place and time-to-volume. · Most up-to-date protection of design and style for testability. · Coverage of sector practices commonly found in commercial DFT tools but not discussed in other guides. · Several, practical examples in each and every chapter illustrating standard VLSI check rules and DFT architectures. · Lecture slides and exercising remedies for all chapters are now obtainable. · Instructors are also eligible for downloading PPT slide information and MSWORD solutions files from the guide site.

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